{"title":"Embedded core testing using broadcast test architecture","authors":"J. H. Jiang, Shih-Chieh Chang, W. Jone","doi":"10.1109/DFTVS.2001.966757","DOIUrl":null,"url":null,"abstract":"Based on the concept of test pattern broadcasting, we propose a new core-based testing method that gives core users the maximum level of test freedom. Instead of only using the test patterns delivered by core providers. core users are allowed to broadcast test patterns to the cores for parallel scan testing. The fault coverage of core testing can be evaluated by an enhanced version of any, traditional fault simulator. The net-list of each core is scrambled before it is delivered to core users, thus the net-list will not be revealed. The enhanced fault simulator has the capabilities of decoding the scrambled net-list and performing fault simulation for the test patterns provided by core users. Both random test patterns (applied by core users) and golden test patterns (delivered by core providers) jointly achieve high and flexible fault coverage requirements. The proposed method has the advantages of minimizing the number of scan pins, reducing the test application time, and achieving maximum level of test quality control by core users. Simulation results demonstrate the feasibility of this method.","PeriodicalId":187031,"journal":{"name":"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","volume":"924 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.2001.966757","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Based on the concept of test pattern broadcasting, we propose a new core-based testing method that gives core users the maximum level of test freedom. Instead of only using the test patterns delivered by core providers. core users are allowed to broadcast test patterns to the cores for parallel scan testing. The fault coverage of core testing can be evaluated by an enhanced version of any, traditional fault simulator. The net-list of each core is scrambled before it is delivered to core users, thus the net-list will not be revealed. The enhanced fault simulator has the capabilities of decoding the scrambled net-list and performing fault simulation for the test patterns provided by core users. Both random test patterns (applied by core users) and golden test patterns (delivered by core providers) jointly achieve high and flexible fault coverage requirements. The proposed method has the advantages of minimizing the number of scan pins, reducing the test application time, and achieving maximum level of test quality control by core users. Simulation results demonstrate the feasibility of this method.