Theoretical analysis of quasi-ballistic hole transport in Ge and Si nanowires focusing on energy relaxation process

Hajime Tanaka, J. Suda, T. Kimoto
{"title":"Theoretical analysis of quasi-ballistic hole transport in Ge and Si nanowires focusing on energy relaxation process","authors":"Hajime Tanaka, J. Suda, T. Kimoto","doi":"10.23919/SNW.2017.8242284","DOIUrl":null,"url":null,"abstract":"The quasi-ballistic hole transport capabilities of Ge and Si NWs were calculated using atomistic electron-phonon coupling and Boltzmann transport equation. Analyzing the forward and backward current fluxes, it was shown that the positive impact of high mobility of Ge is canceled by its slower energy relaxation, which results in comparable transmission coefficients and current transport capabilities between Ge and Si NWs.","PeriodicalId":424135,"journal":{"name":"2017 Silicon Nanoelectronics Workshop (SNW)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 Silicon Nanoelectronics Workshop (SNW)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/SNW.2017.8242284","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

The quasi-ballistic hole transport capabilities of Ge and Si NWs were calculated using atomistic electron-phonon coupling and Boltzmann transport equation. Analyzing the forward and backward current fluxes, it was shown that the positive impact of high mobility of Ge is canceled by its slower energy relaxation, which results in comparable transmission coefficients and current transport capabilities between Ge and Si NWs.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
基于能量松弛过程的锗和硅纳米线准弹道空穴输运理论分析
利用原子电子-声子耦合和玻尔兹曼输运方程计算了锗和硅NWs的准弹道空穴输运能力。对正向和反向电流通量的分析表明,Ge的高迁移率的积极影响被其较慢的能量弛豫所抵消,这使得Ge和Si NWs之间的传输系数和电流输运能力相当。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Revisiting room-temperature 1.54 μιη photoluminescence of ErOx centers in silicon at extremely low concentration Undoped SiGe FETs with metal-insulator-semiconductor contacts Improved electrical characteristics and reliability of multi-stacking PNPN junctionless transistors using channel depletion effect Program/erase speed and data retention trade-off in negative capacitance versatile memory Investigations on dynamic characteristics of ferroelectric Hf02 based on multi-domain interaction model
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1