A reverse-channel, high-voltage lateral IGBT

T. Chow, D. Pattanayak, B. J. Baliga, M. Adler
{"title":"A reverse-channel, high-voltage lateral IGBT","authors":"T. Chow, D. Pattanayak, B. J. Baliga, M. Adler","doi":"10.1109/ISPSD.1994.583647","DOIUrl":null,"url":null,"abstract":"A novel reverse-channel lateral IGBT has been studied with numerical simulations and demonstrated experimentally for the first time. It exhibits a negative differential resistance (NDR) region, which is dependent on the gate voltage and has large peak to valley ratios (10 to >1000), in the I-V characteristics. Also, during dynamic switching, it has been shown to be self-current limiting and hence not to latch up.","PeriodicalId":405897,"journal":{"name":"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"1994-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 6th International Symposium on Power Semiconductor Devices and Ics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.1994.583647","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 20

Abstract

A novel reverse-channel lateral IGBT has been studied with numerical simulations and demonstrated experimentally for the first time. It exhibits a negative differential resistance (NDR) region, which is dependent on the gate voltage and has large peak to valley ratios (10 to >1000), in the I-V characteristics. Also, during dynamic switching, it has been shown to be self-current limiting and hence not to latch up.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
一个反向通道,高压横向IGBT
本文首次对一种新型的反通道横向IGBT进行了数值模拟和实验验证。它表现出负差分电阻(NDR)区域,该区域依赖于栅极电压,在I-V特性中具有较大的峰谷比(10至>1000)。此外,在动态开关过程中,它已被证明是自限流的,因此不会锁存。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
High temperature performance of dielectrically isolated LDMOSFET: characterization, simulation and analysis Improving the gate oxide integrity of very high voltage MCT and IGBT devices by external gettering of metal impurities A trench-gate LIGBT structure and two LMCT structures in SOI substrates Advanced power module using GaAs semiconductors, metal matrix composite packaging material, and low inductance design Improvement of the breakdown voltage of GaAs-FETs using low-temperature-grown GaAs insulator
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1