Improving the testability of mixed-signal integrated circuits

Proceedings of CICC 97 - Custom Integrated Circuits Conference Pub Date : 1997-05-05 DOI:10.1109/CICC.1997.606616

G. Roberts

引用次数: 38

Abstract

The author presents a discussion on several methods that can be used to improve the testability of mixed-signal integrated circuits. He begins by outlining the role of test, and its impact on product cost and qualify. A brief look is taken at the pending test crises for mixed-signal circuits. Subsequently, the author outlines several common test strategies, and their corresponding test setups for verifying the function of the analog portion of a mixed-signal circuit. In the remainder of the paper he describes several analog test buses and circuits for built-in self-test applications.

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提高混合信号集成电路的可测试性

本文讨论了提高混合信号集成电路可测试性的几种方法。他首先概述了测试的作用，以及测试对产品成本和质量的影响。简要介绍一下混合信号电路的未决测试危机。随后，作者概述了几种常见的测试策略，以及用于验证混合信号电路模拟部分功能的相应测试设置。在本文的其余部分，他描述了几种用于内置自检应用的模拟测试总线和电路。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Proceedings of CICC 97 - Custom Integrated Circuits Conference

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