{"title":"Computing stress tests for gate-oxide shorts","authors":"V. Dabholkar, S. Chakravarty","doi":"10.1109/ICVD.1998.646637","DOIUrl":null,"url":null,"abstract":"Reliability screens are used to reduce infant mortality. The quality of the stress test set used during the screening process has a direct bearing on the effectiveness of the screen. We present a formal study of the problem of computing good quality stress tests for gate-oxide shorts which is the cause of much of the reliability problems. A method to compute stress test which is better than the popular method of using I/sub DDQ/ vectors is presented.","PeriodicalId":139023,"journal":{"name":"Proceedings Eleventh International Conference on VLSI Design","volume":"86 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-01-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings Eleventh International Conference on VLSI Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICVD.1998.646637","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Reliability screens are used to reduce infant mortality. The quality of the stress test set used during the screening process has a direct bearing on the effectiveness of the screen. We present a formal study of the problem of computing good quality stress tests for gate-oxide shorts which is the cause of much of the reliability problems. A method to compute stress test which is better than the popular method of using I/sub DDQ/ vectors is presented.
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