A non-quasi-static modular model for HBTs

A. Morris, R. Trew, C. T. Kelley, G. J. Hayes
{"title":"A non-quasi-static modular model for HBTs","authors":"A. Morris, R. Trew, C. T. Kelley, G. J. Hayes","doi":"10.1109/CORNEL.1993.303108","DOIUrl":null,"url":null,"abstract":"Heterojunction bipolar transistors (HBTs) show promise as a high speed and high power density device for many circuit applications. However the quasi-static models found in standard circuit simulation tools can not treat fast transients in HBTs properly. This leads to inaccurate simulations at high frequency and of strongly non-linear operation. To properly account for the charge in transit through the device, non-quasi-static (NQS) models must be used. This work presents a model for the bipolar transistor formed from regional modules. Each module is a NQS solution to a specific region of the transistor and uses material and geometry inputs. These modules are solved for physical consistency during non-linear circuit simulation. The modularization allows appropriate approximations for each region to yield analytic solutions. The input parameters for the model reflect the physical structure of the device as much as possible to provide intuitive results and verifiability. This allows direct device optimization since all parameters are either uncorrelated or their correlations can be derived from process parameters. Thus the device can be optimized in its circuit environment. The model provides for many effects which previously required numerical simulation for accurate results. These include forward and reverse Early, Webster/Rittner, and Kirk/quasisaturation effects. By following the modular modeling scheme, these effects are simply the result of varying boundary conditions on each of the regional solutions. The modular model provides much of the physical insight of numerical models but with computational requirements on the same order as conventional circuit models.<<ETX>>","PeriodicalId":129440,"journal":{"name":"Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits","volume":"16 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE/Cornell Conference on Advanced Concepts in High Speed Semiconductor Devices and Circuits","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CORNEL.1993.303108","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Heterojunction bipolar transistors (HBTs) show promise as a high speed and high power density device for many circuit applications. However the quasi-static models found in standard circuit simulation tools can not treat fast transients in HBTs properly. This leads to inaccurate simulations at high frequency and of strongly non-linear operation. To properly account for the charge in transit through the device, non-quasi-static (NQS) models must be used. This work presents a model for the bipolar transistor formed from regional modules. Each module is a NQS solution to a specific region of the transistor and uses material and geometry inputs. These modules are solved for physical consistency during non-linear circuit simulation. The modularization allows appropriate approximations for each region to yield analytic solutions. The input parameters for the model reflect the physical structure of the device as much as possible to provide intuitive results and verifiability. This allows direct device optimization since all parameters are either uncorrelated or their correlations can be derived from process parameters. Thus the device can be optimized in its circuit environment. The model provides for many effects which previously required numerical simulation for accurate results. These include forward and reverse Early, Webster/Rittner, and Kirk/quasisaturation effects. By following the modular modeling scheme, these effects are simply the result of varying boundary conditions on each of the regional solutions. The modular model provides much of the physical insight of numerical models but with computational requirements on the same order as conventional circuit models.<>
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
hbt的非准静态模块化模型
异质结双极晶体管(hbt)作为一种高速、高功率密度的器件,在许多电路应用中具有广阔的前景。然而,标准电路仿真工具中的准静态模型不能很好地处理hbt中的快速瞬变。这导致在高频和强非线性操作下的不准确模拟。为了正确计算通过设备传输的电荷,必须使用非准静态(NQS)模型。本文提出了一种由区域模块构成的双极晶体管模型。每个模块都是晶体管特定区域的NQS解决方案,并使用材料和几何输入。这些模块在非线性电路仿真中解决了物理一致性问题。模块化允许对每个区域进行适当的近似以产生解析解。模型的输入参数尽可能地反映设备的物理结构,提供直观的结果和可验证性。这允许直接设备优化,因为所有参数要么是不相关的,要么它们的相关性可以从工艺参数推导出来。因此,该器件可以在其电路环境中进行优化。该模型提供了许多以前需要数值模拟才能得到准确结果的效应。这些包括正向和反向早期,韦伯斯特/里特纳和柯克/准饱和效应。通过遵循模块化建模方案,这些影响仅仅是每个区域解的不同边界条件的结果。模块化模型提供了许多数值模型的物理洞察力,但具有与传统电路模型相同顺序的计算要求。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
LT-GaAs-MIS-diode characteristics and equivalent circuit model Reliability of strained quantum well lasers Development of an appropriate model for the design of D-band InP Gunn devices p/sup +/-thin surface layer Schottky-barrier enhanced high speed pseudomorphic Al/sub 0.25/Ga/sub 0.75/As/In/sub 0.15/Ga/sub 0.85/As and Ga/sub 0.5/In/sub 0.5/P/In/sub 0.15/Ga/sub 0.85/As MODFETs Monte Carlo simulation of wide AlGaAs barriers
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1