K. Frigui, S. Bila, D. Baillargeat, A. Catherinot, S. Verdeyme, J. Puech, L. Estagerie, D. Pacaud, H. Dillenbourg
{"title":"A solution to relax breakdown threshold in waveguide filters","authors":"K. Frigui, S. Bila, D. Baillargeat, A. Catherinot, S. Verdeyme, J. Puech, L. Estagerie, D. Pacaud, H. Dillenbourg","doi":"10.23919/EUMC.2012.6459200","DOIUrl":null,"url":null,"abstract":"While characterizing OMUX filters at atmospheric pressure, electrical breakdown can occur involuntarily and damage the equipment. The phenomenon of breakdown was studied and our objective was to propose a multi-physical modeling, in order to predict the critical input power which can generate such a microwave breakdown. In this paper we present the microwave breakdown threshold at several frequency bands and we propose a solution to relax the microwave breakdown threshold.","PeriodicalId":243164,"journal":{"name":"2012 7th European Microwave Integrated Circuit Conference","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 7th European Microwave Integrated Circuit Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.23919/EUMC.2012.6459200","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
While characterizing OMUX filters at atmospheric pressure, electrical breakdown can occur involuntarily and damage the equipment. The phenomenon of breakdown was studied and our objective was to propose a multi-physical modeling, in order to predict the critical input power which can generate such a microwave breakdown. In this paper we present the microwave breakdown threshold at several frequency bands and we propose a solution to relax the microwave breakdown threshold.