Deletion and selection model for test case selection

A. Lawanna, Jittima Wongwuttiwaat, B. Srisura
{"title":"Deletion and selection model for test case selection","authors":"A. Lawanna, Jittima Wongwuttiwaat, B. Srisura","doi":"10.1109/ECTICON.2016.7561387","DOIUrl":null,"url":null,"abstract":"Deletion and selection model is planned for improving the ability of selecting the relevant test cases of the modified programs by comparing the outcomes with the well-known traditional methods, which are random, dataflow, slicing, model based, code based, and coverage based analysis. This is because after adapting the programs for several times, numbers of test case will increase that can drop the whole performance of the new version. The problems are time consuming and producing bugs and other failures when using the updated software. The proposed model consists two main algorithms, which are deletion and selection regarding classifying types of the requirements. According to this, the percent of reducing the size by using the proposed model is better than the traditional methods. Besides, percent of finding bugs of the six comparative studies are higher than the offered technique approximately 55%. Moreover, the efficiency of applying the proposed method is greater than the existing technique as about 86 %.","PeriodicalId":200661,"journal":{"name":"2016 13th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 13th International Conference on Electrical Engineering/Electronics, Computer, Telecommunications and Information Technology (ECTI-CON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTICON.2016.7561387","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Deletion and selection model is planned for improving the ability of selecting the relevant test cases of the modified programs by comparing the outcomes with the well-known traditional methods, which are random, dataflow, slicing, model based, code based, and coverage based analysis. This is because after adapting the programs for several times, numbers of test case will increase that can drop the whole performance of the new version. The problems are time consuming and producing bugs and other failures when using the updated software. The proposed model consists two main algorithms, which are deletion and selection regarding classifying types of the requirements. According to this, the percent of reducing the size by using the proposed model is better than the traditional methods. Besides, percent of finding bugs of the six comparative studies are higher than the offered technique approximately 55%. Moreover, the efficiency of applying the proposed method is greater than the existing technique as about 86 %.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
用于测试用例选择的删除和选择模型
通过与传统的随机分析、数据流分析、切片分析、基于模型分析、基于代码分析、基于覆盖率分析的结果对比,规划了删除和选择模型的模型模型,以提高对修改后程序的相关测试用例的选择能力。这是因为在对程序进行多次调整之后,测试用例的数量将会增加,从而降低新版本的整体性能。在使用更新后的软件时,这些问题很耗时,而且会产生错误和其他故障。该模型主要包括两种算法:删除算法和选择算法。由此可见,使用该模型的尺寸缩减率优于传统方法。此外,六种比较研究的bug发现率都比提供的技术高约55%。此外,应用该方法的效率约为86%,高于现有技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Flexible affix classification for stemming Indonesian Language Performance evaluation of DVB-T2 propagation for fixed reception Firmware design and development of MCU and Matlab-Simulink interfacing for real-time measurement, analysis and control applications A control strategy for a matrix converter based on Venturini method under unbalanced input voltage conditions Suspended graphene applications in NEMS and MEMS
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1