A unified multi-axial sub-micron fatigue tester with applications to electronic packaging materials

Minfu Lu, W. Ren, Sheng Liu, D. Shangguan
{"title":"A unified multi-axial sub-micron fatigue tester with applications to electronic packaging materials","authors":"Minfu Lu, W. Ren, Sheng Liu, D. Shangguan","doi":"10.1109/ECTC.1997.606159","DOIUrl":null,"url":null,"abstract":"A recently developed multi-axial sub-micron thermomechanical fatigue tester has been used for investigating the behaviors of small specimens, particularly in the field of electronic packaging materials and structures. Materials tested include a copper wire, polycarbonate and polyimide films and a lead-free solder alloy. An active alignment monitoring and adjustment has been found to be important for realistic characteristics of tiny points.","PeriodicalId":339633,"journal":{"name":"1997 Proceedings 47th Electronic Components and Technology Conference","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"10","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 Proceedings 47th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1997.606159","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 10

Abstract

A recently developed multi-axial sub-micron thermomechanical fatigue tester has been used for investigating the behaviors of small specimens, particularly in the field of electronic packaging materials and structures. Materials tested include a copper wire, polycarbonate and polyimide films and a lead-free solder alloy. An active alignment monitoring and adjustment has been found to be important for realistic characteristics of tiny points.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
应用于电子封装材料的统一多轴亚微米疲劳测试仪
本文介绍了一种新研制的多轴亚微米热-机械疲劳试验机,用于研究电子封装材料和结构的小试件行为。测试的材料包括铜线、聚碳酸酯和聚酰亚胺薄膜以及无铅焊料合金。主动的对中监测和调整对微小点的真实特性至关重要。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
High density optical interconnects for board and backplane applications using VCSELs and polymer waveguides Evaluation of plastic package delamination via reliability testing and fracture mechanics approach Mid-frequency simultaneous switching noise in computer systems Distance learning paradigms in electronics packaging: a national course on thermal design of electronic products Mechanical and electrical characterization of a dendrite connector
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1