{"title":"A 488×430 interline transfer CCD imager with integrated exposure and blooming control","authors":"T. Chan, O. Barrett, C. Chen, Y. Abendini, D. Wen","doi":"10.1109/ISSCC.1984.1156624","DOIUrl":null,"url":null,"abstract":"A 488-element NTSC-compatible CCD imager with a 2/3\" format device utilizing a differentially-diffused drain for variable exposure control and element antiblooming will be coverecL","PeriodicalId":260117,"journal":{"name":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"44 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1984.1156624","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 8
Abstract
A 488-element NTSC-compatible CCD imager with a 2/3" format device utilizing a differentially-diffused drain for variable exposure control and element antiblooming will be coverecL
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