CMOS MEMS infrared source based on black silicon

Weibing Liu, A. Ming, Yaohui Ren, Qiu-lin Tan, W. Ou, Xilong Sun, Weibing Wang, Dapeng Chen, J. Xiong
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引用次数: 4

Abstract

In this work, a MEMS infrared source applied to compact Non-Dispersive Infrared (NDIR) gas sensor is reported. Compared to other related things, the source coats integrated nanostructure black silicon compatible with CMOS technique on the poly-silicon. Hence the emissivity is as high as 98% at 3~5μm wave range; relatively the radiation efficiency is increased by 40% through calculation. Suspension structure and DRIE release process of the back side are used in the design to reduce the heat conduction losses, and the source is only sized 3×3mm2 suitable for mass production. After being packed, the source can rapidly heat in 20 ms, besides the modulation depth can reach 30% below 50Hz, which all meet the requirements of the NDIR gas sensor.
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基于黑硅的CMOS MEMS红外源
本文报道了一种用于紧凑型非色散红外(NDIR)气体传感器的MEMS红外源。与其他相关材料相比,该材料在多晶硅上涂覆了与CMOS技术兼容的集成纳米结构黑硅。在3~5μm波段,发射率高达98%;通过计算,辐射效率相对提高了40%。设计中采用了悬挂结构和背面DRIE释放工艺,减少了热传导损失,且源尺寸仅为3×3mm2,适合量产。封装后的光源可在20ms内快速升温,且在50Hz以下调制深度可达30%,均满足NDIR气体传感器的要求。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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