Improve transition fault diagnosability via observation point insertion

Cheng-Hung Wu, Yi-Da Wang, Kuen-Jong Lee
{"title":"Improve transition fault diagnosability via observation point insertion","authors":"Cheng-Hung Wu, Yi-Da Wang, Kuen-Jong Lee","doi":"10.1109/VLSI-DAT.2015.7114571","DOIUrl":null,"url":null,"abstract":"In this work, a design for diagnosability (DFD) method based on observation point (OP) insertion is proposed to improve the diagnosis resolution of transition faults in a circuit. The main objective is to minimize the number of observation points since this number will directly affect the area overhead of the circuit. We develop a novel algorithm to generate a set of OP candidates and then select a minimal number of OPs from this set which can distinguish all targeted fault pairs. An observation point insertion logic is also proposed that can efficiently reuse the output pins in the original circuit so as to reduce the number of extra output pins. In addition, a novel structural distance calculation method for synthesized circuits is proposed that considers the mixed structure of primitive gates and complicated gates, including AOI or OAI gates. Experimental results show that after applying the OP insertion method, all aborted fault pairs can be distinguished and the number of required observation points is quite small. We also use the observation points to distinguish those indistinguished far-away fault pairs. Experimental results show that all targeted fault pairs can be distinguished with a few observation points and a set of diagnosis patterns for ISCAS89 and ITC99 circuits.","PeriodicalId":369130,"journal":{"name":"VLSI Design, Automation and Test(VLSI-DAT)","volume":"273 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"VLSI Design, Automation and Test(VLSI-DAT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSI-DAT.2015.7114571","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

In this work, a design for diagnosability (DFD) method based on observation point (OP) insertion is proposed to improve the diagnosis resolution of transition faults in a circuit. The main objective is to minimize the number of observation points since this number will directly affect the area overhead of the circuit. We develop a novel algorithm to generate a set of OP candidates and then select a minimal number of OPs from this set which can distinguish all targeted fault pairs. An observation point insertion logic is also proposed that can efficiently reuse the output pins in the original circuit so as to reduce the number of extra output pins. In addition, a novel structural distance calculation method for synthesized circuits is proposed that considers the mixed structure of primitive gates and complicated gates, including AOI or OAI gates. Experimental results show that after applying the OP insertion method, all aborted fault pairs can be distinguished and the number of required observation points is quite small. We also use the observation points to distinguish those indistinguished far-away fault pairs. Experimental results show that all targeted fault pairs can be distinguished with a few observation points and a set of diagnosis patterns for ISCAS89 and ITC99 circuits.
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通过观测点插入提高过渡故障的可诊断性
为了提高电路过渡故障的诊断解析度,提出了一种基于观测点插入的可诊断性方法。主要目标是最小化观察点的数量,因为这个数量将直接影响电路的面积开销。我们提出了一种新的算法来生成一组候选故障点,然后从该候选故障点中选择能够区分所有目标故障对的最小数目的故障点。提出了一种观察点插入逻辑,可以有效地重用原电路中的输出引脚,从而减少多余的输出引脚数量。此外,提出了一种考虑原始门和复杂门(包括AOI门或OAI门)混合结构的合成电路结构距离计算方法。实验结果表明,应用OP插入方法后,可以区分出所有的失效故障对,所需的观测点数量很少。我们还利用观测点来区分那些无法区分的远距离断层对。实验结果表明,对于ISCAS89和ITC99电路,利用少量的观察点和一套诊断模式可以区分出所有的目标故障对。
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