Method of automated BIT false alarms simulation based on EDA

Junyou Shi, Jin-zhong Li, Meng Shi
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引用次数: 5

Abstract

The principle of built-in test false alarm simulation (BFAS) is analyzed, with the definition of BFAS in this paper. Related false alarm inducing factors simulated by electronic design automation (EDA) techniques are determined, including load variations, power supply disturbances and electromagnetic interferences. The concept of false alarm simulation profile is proposed. The types and simulation modes of false alarm inducing events are analyzed. The automated insertion algorithm of false alarm inducing events and the flow of BFAS are established, and verified using a typical circuit. It is shown that this method is feasible and effective, and can be used to analyze false alarms in the development stage.
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基于EDA的BIT虚警自动仿真方法
分析了内建测试虚警仿真的原理,给出了内建测试虚警仿真的定义。确定了电子设计自动化(EDA)技术模拟的相关虚警诱发因素,包括负载变化、电源干扰和电磁干扰。提出了虚警仿真剖面的概念。分析了虚警诱导事件的类型和仿真方式。建立了虚警诱导事件的自动插入算法和BFAS的流程,并用典型电路进行了验证。结果表明,该方法是可行和有效的,可用于开发阶段的虚警分析。
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