{"title":"A performance driven generator for efficient testable conditional-sum-adders","authors":"B. Becker, P. Molitor","doi":"10.1109/EURDAC.1992.246217","DOIUrl":null,"url":null,"abstract":"The authors present a performance driven generator for integer adders which is parameterized in n, the operands' bit length, t/sub n/, the delay of the addition, and FM, the (cell based static) fault model. FM may in particular be chosen as the classical stuck-at fault model or the cellular fault model. The output of the generator is an area-minimal n-bit adder of the conditional-sum type with delay <or=t/sub n/ (if such a circuit exists at all). The number of test vectors constructed is bounded by O(n/sup 2/). The running time of the generator itself is about c*n/sup 2/*t/sub n/ where c is a small constant.<<ETX>>","PeriodicalId":218056,"journal":{"name":"Proceedings EURO-DAC '92: European Design Automation Conference","volume":"39 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings EURO-DAC '92: European Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EURDAC.1992.246217","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
The authors present a performance driven generator for integer adders which is parameterized in n, the operands' bit length, t/sub n/, the delay of the addition, and FM, the (cell based static) fault model. FM may in particular be chosen as the classical stuck-at fault model or the cellular fault model. The output of the generator is an area-minimal n-bit adder of the conditional-sum type with delay >