Analysis of silicone-based adhesive bond separation

Abstract

Silicone-based adhesive bond separations on polymer and ceramic-based samples were analyzed. Scanning electron microscopy (SEM) and energy dispersive X-ray spectroscopy (EDX), Fourier transform infra-red spectroscopy (FTIR) and Gas chromatography mass spectrometry (GCMS) analyses were conducted on surfaces of glass fiber reinforced polybutylene terephthalate (PBT) and aluminum nitride samples. Further surface analyses, i.e. surface contact angle measurement, X-ray photoelectron spectroscopy (XPS) and time of flight secondary ion mass spectrometry (TOF-SIMS) indicates that the adhesive bond separation could have been caused by excessive sulfur content on the PBT surface and excessive residual organic compound containing hydroxyl functional group on aluminum nitride surface. Potential separation mechanisms of the adhesive bond for these two case studies were also discussed.