Challenges in high density PCB with 0.40 mm pitch BGA - From design, fabrication & assembly perspective

Leaw Pang Tun, L. Peng
{"title":"Challenges in high density PCB with 0.40 mm pitch BGA - From design, fabrication & assembly perspective","authors":"Leaw Pang Tun, L. Peng","doi":"10.1109/ASQED.2009.5206301","DOIUrl":null,"url":null,"abstract":"Today's electronic products are required to be increasingly small, fast, low power, light weight and feature-rich. These requirements have been converted to the electronic domain as smaller IC package with higher number of I/O. To accommodate higher I/O in a shrinking package size, the pin pitch needs to be reduced tremendously. To align with the drastic growth of package technology, PCB technology needs to advance in the area of design, fabrication and assembly to support the fine pitch package interconnection to PCB. This paper attempts to elaborate the challenges in supporting high density PCB with 0.40 mm pitch BGA from design, fabrication and assembly perspective, as well as discussing the current workarounds and solutions to the challenges and difficulties faced with today PCB technology.","PeriodicalId":437303,"journal":{"name":"2009 1st Asia Symposium on Quality Electronic Design","volume":"104 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 1st Asia Symposium on Quality Electronic Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASQED.2009.5206301","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Today's electronic products are required to be increasingly small, fast, low power, light weight and feature-rich. These requirements have been converted to the electronic domain as smaller IC package with higher number of I/O. To accommodate higher I/O in a shrinking package size, the pin pitch needs to be reduced tremendously. To align with the drastic growth of package technology, PCB technology needs to advance in the area of design, fabrication and assembly to support the fine pitch package interconnection to PCB. This paper attempts to elaborate the challenges in supporting high density PCB with 0.40 mm pitch BGA from design, fabrication and assembly perspective, as well as discussing the current workarounds and solutions to the challenges and difficulties faced with today PCB technology.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
从设计,制造和组装的角度来看,0.40 mm间距BGA高密度PCB的挑战
当今的电子产品要求越来越小、快、低功耗、轻重量和功能丰富。这些要求已经转化为电子领域更小的集成电路封装与更高数量的I/O。为了在不断缩小的封装尺寸中容纳更高的I/O,引脚间距需要大大减小。为了配合封装技术的急剧增长,PCB技术需要在设计、制造和组装领域取得进步,以支持与PCB的细间距封装互连。本文试图从设计、制造和组装的角度阐述支持0.40 mm间距BGA的高密度PCB所面临的挑战,并讨论当前PCB技术面临的挑战和困难的解决方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Next generation I/O power delivery design through SIPD co-analysis & comprehensive platform validation Effect of local random variation on gate-level delay and leakage statistical analysis Mutual exploration of FinFET technology and circuit design options for implementing compact brute-force latches Automatic error recovery in targetless logic emulation An automated approach for the diagnosis of multiple faults in FPGA interconnects
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1