High-performance and low-power challenges for sub-70 nm microprocessor circuits

R. Krishnamurthy, A. Alvandpour, V. De, S. Borkar
{"title":"High-performance and low-power challenges for sub-70 nm microprocessor circuits","authors":"R. Krishnamurthy, A. Alvandpour, V. De, S. Borkar","doi":"10.1109/CICC.2002.1012781","DOIUrl":null,"url":null,"abstract":"CMOS technology scaling is becoming difficult beyond 70 nm node, raising new design challenges for high-performance and low-power microprocessors. This paper discusses some of the key paradigm shifts required. Circuit techniques to combat (i) increasing switching and leakage power dissipation, (ii) poor leakage tolerance of large-signal cache arrays and register files, and (iii) worsening global on-chip interconnect scaling trend, are described.","PeriodicalId":209025,"journal":{"name":"Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"107","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2002 Custom Integrated Circuits Conference (Cat. No.02CH37285)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CICC.2002.1012781","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 107

Abstract

CMOS technology scaling is becoming difficult beyond 70 nm node, raising new design challenges for high-performance and low-power microprocessors. This paper discusses some of the key paradigm shifts required. Circuit techniques to combat (i) increasing switching and leakage power dissipation, (ii) poor leakage tolerance of large-signal cache arrays and register files, and (iii) worsening global on-chip interconnect scaling trend, are described.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
70纳米以下微处理器电路的高性能和低功耗挑战
CMOS技术在70纳米节点以上的扩展变得越来越困难,这给高性能和低功耗微处理器的设计带来了新的挑战。本文讨论了所需的一些关键范式转变。本文描述了解决以下问题的电路技术:(i)增加开关和泄漏功耗,(ii)大信号缓存阵列和寄存器文件的差泄漏容限,以及(iii)全球片上互连缩放趋势恶化。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
A signal integrity-driven buffer insertion technique for post-routing noise and delay optimization Modularized low temperature LNO/PZT/LNO ferroelectric capacitor-over-interconnect (COI) FeRAM for advanced SOC (ASOC) application SOI Hall effect sensor operating up to 270/spl deg/C A 402-output TFT-LCD driver IC with power-controlling function by selecting number of colors Understanding MOSFET mismatch for analog design
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1