{"title":"An economical, precise and limited access In-Circuit Test method for pulse-width modulation (PWM) circuits","authors":"Albert Yeh, Jesse Chou, M. Lin","doi":"10.1109/TEST.2009.5355755","DOIUrl":null,"url":null,"abstract":"A technology is introduced that tests PWM circuits using a newly-developed single high-impedance test sensor probe versus the traditional In-Circuit Test (ICT) methods. Test accuracy is achieved while on-board test points and fixture probes are significantly reduced","PeriodicalId":419063,"journal":{"name":"2009 International Test Conference","volume":"40 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Test Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/TEST.2009.5355755","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A technology is introduced that tests PWM circuits using a newly-developed single high-impedance test sensor probe versus the traditional In-Circuit Test (ICT) methods. Test accuracy is achieved while on-board test points and fixture probes are significantly reduced
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