Techniques for developing and testing microprocessor systems

C. Hudson
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引用次数: 2

Abstract

Testing microprocessor systems at the development stage can take up to a third of the total development time and yet techniques for testing may only be thought about once the design stage has been undertaken. A correct approach to testing can considerably reduce the time needed to take a prototype through to a working system, and this not only means that a product can be on the market faster, but the development costs can be considerably reduced. The paper looks at the techniques and requirements for testing microprocessor-based systems and suggests alternatives to expensive development systems.
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开发和测试微处理器系统的技术
在开发阶段测试微处理器系统可能占用总开发时间的三分之一,但测试技术可能只有在设计阶段进行后才会被考虑。正确的测试方法可以大大减少从原型到工作系统所需的时间,这不仅意味着产品可以更快地投放市场,而且可以大大降低开发成本。本文着眼于测试基于微处理器的系统的技术和需求,并提出了昂贵的开发系统的替代方案。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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Simulating hardware structures in occam Techniques for developing and testing microprocessor systems Design considerations for a single-chip fault tolerant VLSI microprocessor The development of fault tolerant computer systems using dual processing techniques Fault tolerance and self-checking techniques in microprocessor-based system design
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