{"title":"An energy-efficient resilient flip-flop circuit with built-in timing-error detection and correction","authors":"Che-Min Huang, Tsung-Te Liu, T. Chiueh","doi":"10.1109/VLSI-DAT.2015.7114574","DOIUrl":null,"url":null,"abstract":"This paper presents a timing error resilient flip-flop (ERFF) circuit with high energy-efficiency. The proposed flip-flop design automatically corrects timing errors and therefore minimizes the performance degradation due to variations. The simulation results show that the proposed design can achieve better energy-efficiency in ISCAS'89 benchmark circuits and LEON3 integer-processing unit, when compared to other state-of-the-art timing error detection and correction methods.","PeriodicalId":369130,"journal":{"name":"VLSI Design, Automation and Test(VLSI-DAT)","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"16","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"VLSI Design, Automation and Test(VLSI-DAT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VLSI-DAT.2015.7114574","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 16
Abstract
This paper presents a timing error resilient flip-flop (ERFF) circuit with high energy-efficiency. The proposed flip-flop design automatically corrects timing errors and therefore minimizes the performance degradation due to variations. The simulation results show that the proposed design can achieve better energy-efficiency in ISCAS'89 benchmark circuits and LEON3 integer-processing unit, when compared to other state-of-the-art timing error detection and correction methods.