Novel approaches for fault detection in two-dimensional combinational arrays

Xiao-Tao Chen, Wei-Kang Huang, N. Park, F. Meyer, F. Lombardi
{"title":"Novel approaches for fault detection in two-dimensional combinational arrays","authors":"Xiao-Tao Chen, Wei-Kang Huang, N. Park, F. Meyer, F. Lombardi","doi":"10.1109/DFTVS.2001.966765","DOIUrl":null,"url":null,"abstract":"This paper presents new approaches for the constant (C)-testability of orthogonal (two-dimensional) arrays of combinational cells. A novel testability condition referred to as CO-testability is introduced: a testing approach for CO-testability is fully characterized based on adding states to the table of a cell. A second approach is also proposed. this approach is based on adding a variable number of additional states to a cell with a known table. This approach requires at most (m+k+/spl alpha/)(n+k+/spl alpha/)( m/k+1)(n/k+1) tests, where m and n are the number of states in the two dimensions of signal flow, /spl alpha/=1(0) if (partial) fail observability is applicable to the state table and k is the variable number of additional states per direction (2/spl les/k/spl les/m.n). As an example, the proposed approaches have been applied to a two-dimensional array for maximum/minimum comparison.","PeriodicalId":187031,"journal":{"name":"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 2001 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.2001.966765","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4

Abstract

This paper presents new approaches for the constant (C)-testability of orthogonal (two-dimensional) arrays of combinational cells. A novel testability condition referred to as CO-testability is introduced: a testing approach for CO-testability is fully characterized based on adding states to the table of a cell. A second approach is also proposed. this approach is based on adding a variable number of additional states to a cell with a known table. This approach requires at most (m+k+/spl alpha/)(n+k+/spl alpha/)( m/k+1)(n/k+1) tests, where m and n are the number of states in the two dimensions of signal flow, /spl alpha/=1(0) if (partial) fail observability is applicable to the state table and k is the variable number of additional states per direction (2/spl les/k/spl les/m.n). As an example, the proposed approaches have been applied to a two-dimensional array for maximum/minimum comparison.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
二维组合阵列故障检测的新方法
本文提出了组合单元正交(二维)阵列常(C)可检验性的新方法。引入了一种新的可测性条件,称为共可测性:一种基于向细胞表中添加状态的共可测性测试方法。本文还提出了第二种方法。这种方法基于向具有已知表的单元格添加可变数量的附加状态。该方法最多需要(m+k+/spl alpha/)(n+k+/spl alpha/)(m/k+1)(n/k+1)次测试,其中m和n是信号流两个维度的状态数,如果(部分)失败,可观测性适用于状态表,/spl alpha/=1(0), k是每个方向的可变附加状态数(2/spl les/k/spl les/m.n)。作为一个例子,所提出的方法已应用于一个二维数组的最大/最小比较。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
An on-chip detection circuit for the verification of IC supply connections Unequal error protection codes with two-level burst and capabilities Sensitivity and reliability evaluation for mixed-signal ICs under electromigration and hot-carrier effects Error detection of arithmetic circuits using a residue checker with signed-digit number system Comparison and application of different VHDL-based fault injection techniques
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1