Jongeun Koo, Eunwoo Song, Eunhyeok Park, Dongyoung Kim, Junki Park, Sungju Ryu, S. Yoo, Jae-Joon Kim
{"title":"Area-efficient one-cycle correction scheme for timing errors in flip-flop based pipelines","authors":"Jongeun Koo, Eunwoo Song, Eunhyeok Park, Dongyoung Kim, Junki Park, Sungju Ryu, S. Yoo, Jae-Joon Kim","doi":"10.1109/ASSCC.2016.7844154","DOIUrl":null,"url":null,"abstract":"We propose a new timing error correction scheme for area-efficient design of flip-flop based pipeline. Key features in the proposed scheme are 1) one-cycle error correction using a new local stalling scheme and 2) selective replacement of the error detection and correction flip-flops in critical paths only. A 32-bit MIPS testchip in a 65 nm CMOS technology has been implemented as a testbed. By employing the proposed scheme in the flop-flop based pipeline, the area overhead due to the retiming process (∼21%) in the previous two-phase transparent latch based scheme can be eliminated. In addition, substantial area saving (16%) can be achieved compared to the state-of-the-art flip-flop based scheme thanks to the selective replacement of the error detection and correction flip-flops.","PeriodicalId":278002,"journal":{"name":"2016 IEEE Asian Solid-State Circuits Conference (A-SSCC)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 IEEE Asian Solid-State Circuits Conference (A-SSCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASSCC.2016.7844154","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
We propose a new timing error correction scheme for area-efficient design of flip-flop based pipeline. Key features in the proposed scheme are 1) one-cycle error correction using a new local stalling scheme and 2) selective replacement of the error detection and correction flip-flops in critical paths only. A 32-bit MIPS testchip in a 65 nm CMOS technology has been implemented as a testbed. By employing the proposed scheme in the flop-flop based pipeline, the area overhead due to the retiming process (∼21%) in the previous two-phase transparent latch based scheme can be eliminated. In addition, substantial area saving (16%) can be achieved compared to the state-of-the-art flip-flop based scheme thanks to the selective replacement of the error detection and correction flip-flops.