{"title":"Material Model and Simulation of Multilayer-AgSn-Foils for Transient-Liquid-Phase Bonding of Sensor Elements","authors":"M. Feißt, Cong Li, J. Wilde","doi":"10.1109/EUROSIME.2019.8724544","DOIUrl":null,"url":null,"abstract":"Thermo-mechanical deformation caused by the CTE-mismatch between device and substrate material is a severe problem for the mounting of sensor MEMS. FEM-simulations are helpful within the design process to minimize and predict errors of the output. Even when low-temperature interconnect methods like Transient-Liquid-Phase bonding are used simulations still might reduce costs in the development process. In this work, a material model for TLP-interconnects out of AgSn-alloys is presented. The elastic and plastic mechanical properties and CTE are determined for a temperature range between $25 ^ { \\circ } \\mathrm { C }$ and $200 ^{\\circ}\\mathrm {C}$. A combination of optical measurement for the strain, heating, and tensile testing was used for the experiments. Subsequently, the material data were used to analyze the thermo-mechanical behavior of a pressure sensor. On this example, the advantages of TLP-bonding were shown.","PeriodicalId":357224,"journal":{"name":"2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 20th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EUROSIME.2019.8724544","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
Thermo-mechanical deformation caused by the CTE-mismatch between device and substrate material is a severe problem for the mounting of sensor MEMS. FEM-simulations are helpful within the design process to minimize and predict errors of the output. Even when low-temperature interconnect methods like Transient-Liquid-Phase bonding are used simulations still might reduce costs in the development process. In this work, a material model for TLP-interconnects out of AgSn-alloys is presented. The elastic and plastic mechanical properties and CTE are determined for a temperature range between $25 ^ { \circ } \mathrm { C }$ and $200 ^{\circ}\mathrm {C}$. A combination of optical measurement for the strain, heating, and tensile testing was used for the experiments. Subsequently, the material data were used to analyze the thermo-mechanical behavior of a pressure sensor. On this example, the advantages of TLP-bonding were shown.