Binary pattern matching from a local dissimilarity measure

Abstract

This communication deals with finding the position of a reference shape in a given image. The proposed matcher is constructed from local dissimilarity maps. These maps allow to efficiently and robustly measure the differences between two images. It is shown an example that the matcher potentially returns less false-positives than a reference method (chamfer matching). This is possible as the local dissimilarity measure is symmetric, which makes it more robust to noise. We show that the proposed matcher is a generalization of the chamfer matching. It also allows fast computation times. A good robustness to noise is confirmed from presented simulations.