Agile Pathfinding Technology Prototyping: the Hunt for Directional Correctness

D. Chanemougame, Jeffrey Smith, P. Gutwin, Brandon Byrns, L. Liebmann
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引用次数: 1

Abstract

New tools and methodologies are fused with conventional elements of the process-design-kit (PDK) and design enablement to introduce a rigorous yet fast and agile technology prototyping platform. This design technology cooptimization (DTCO) solution replaces the rigid, time and resources consuming PDK to enhance the core functions critical to evaluate power, performance area and cost (PPAC). Any technology definition with any device or process integration innovation can be evaluated at the standard cell level first, and then at the block level to explore and understand the requirements of different design applications. The flexibility and fast turn-around make it practical to imagine, test and compare many technology prototypes. From simple evolutions to innovative disruptions, the feasibility and value of the technology choices and hardware tools required can be identified early with great detail, significantly accelerating the development of future process tools. To illustrate the efficiency of the platform, complementary-FET (CFET) [1] technologies are compared to reference finFET technologies. As we approach the fundamental limits of dimensional scaling, with so many choices ahead of us including 3D constructs, we need efficient technology prototyping to navigate and steer in the right direction.
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敏捷寻径技术原型:寻找方向的正确性
新的工具和方法与流程设计套件(PDK)和设计支持的传统元素融合在一起,以引入一个严格但快速和敏捷的技术原型平台。该设计技术协同优化(DTCO)解决方案取代了刚性、耗时和资源消耗的PDK,以增强对评估功率、性能区域和成本(PPAC)至关重要的核心功能。任何具有任何设备或工艺集成创新的技术定义都可以首先在标准单元级别进行评估,然后在块级别进行评估,以探索和了解不同设计应用的需求。灵活性和快速的周转使得想象、测试和比较许多技术原型变得可行。从简单的演变到创新的中断,技术选择和所需硬件工具的可行性和价值可以在早期以非常详细的方式确定,从而显著地加速未来过程工具的开发。为了说明该平台的效率,将互补场效应管(CFET)[1]技术与参考finFET技术进行了比较。当我们接近维度缩放的基本极限时,我们面前有很多选择,包括3D结构,我们需要有效的技术原型来导航和引导正确的方向。
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