{"title":"Laser beam characterization","authors":"A. Katrich, A. A. Katrich, I. Priz","doi":"10.1109/LFNM.2000.854033","DOIUrl":null,"url":null,"abstract":"In commercial applications the laser beam is a product and then it has to be characterized by the set of the parameters to be compared and to be used. These parameters are standardized and ISO-standards are the basis for the developing of national ones. The discussion at the 5th International Workshop for the Laser Beam and Optics Characterization (LBOC5, Erice, Italy, 20-25.03.2000) has shown that inorder to satisfy demands of the users and developers of the lasers a lot of the methods and definitions have to be modified. At first it was concerned with the beam diagnostics of the novel laser devices: ultra-short-pulsed, DUV/VUV lasers for lithography and diode lasers for communications and industry. To solve these problems the new EUREKA project CHOCLABII (EU 2359) will start in 2000 to organize the cooperation with many research facilities in more, than 12 countries.","PeriodicalId":265943,"journal":{"name":"Proceedings of LFNM'2000. 2nd International Workshop on Laser and Fiber-Optical Networks Modeling (Cat. No.00EX419)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of LFNM'2000. 2nd International Workshop on Laser and Fiber-Optical Networks Modeling (Cat. No.00EX419)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/LFNM.2000.854033","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
In commercial applications the laser beam is a product and then it has to be characterized by the set of the parameters to be compared and to be used. These parameters are standardized and ISO-standards are the basis for the developing of national ones. The discussion at the 5th International Workshop for the Laser Beam and Optics Characterization (LBOC5, Erice, Italy, 20-25.03.2000) has shown that inorder to satisfy demands of the users and developers of the lasers a lot of the methods and definitions have to be modified. At first it was concerned with the beam diagnostics of the novel laser devices: ultra-short-pulsed, DUV/VUV lasers for lithography and diode lasers for communications and industry. To solve these problems the new EUREKA project CHOCLABII (EU 2359) will start in 2000 to organize the cooperation with many research facilities in more, than 12 countries.
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