Enhancing the robustness of a multiple floating field-limiting ring termination by introducing a buffer layer

P. Vanmeerbeek, J. Roig, F. Bogman, P. Moens, A. Villamor-Baliarda, D. Flores
{"title":"Enhancing the robustness of a multiple floating field-limiting ring termination by introducing a buffer layer","authors":"P. Vanmeerbeek, J. Roig, F. Bogman, P. Moens, A. Villamor-Baliarda, D. Flores","doi":"10.1109/ISPSD.2012.6229095","DOIUrl":null,"url":null,"abstract":"A planar multiple floating field-limiting ring structure, designed for above 600V blocking capability, is analyzed in this work. We have proven by simulation and experiment that adding a well designed buffer layer in the epi-substrate region counteracts on the drop in electric field which is due to the space charge limited current and as such the buffer enhances the robustness towards reverse voltage biasing.","PeriodicalId":371298,"journal":{"name":"2012 24th International Symposium on Power Semiconductor Devices and ICs","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 24th International Symposium on Power Semiconductor Devices and ICs","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPSD.2012.6229095","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

A planar multiple floating field-limiting ring structure, designed for above 600V blocking capability, is analyzed in this work. We have proven by simulation and experiment that adding a well designed buffer layer in the epi-substrate region counteracts on the drop in electric field which is due to the space charge limited current and as such the buffer enhances the robustness towards reverse voltage biasing.
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通过引入缓冲层来增强多浮动限域环终端的鲁棒性
本文分析了一种具有600V以上阻塞能力的平面多浮式限磁环结构。我们已经通过仿真和实验证明,在外延衬底区域添加一个设计良好的缓冲层可以抵消由于空间电荷限制电流引起的电场下降,因此缓冲层增强了对反向电压偏置的鲁棒性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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