Effect of potential on the conductivity of electrodeposited Cu2O film

Ying Yang, Juan Han, X. Ning, Hongsheng Tang
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引用次数: 2

Abstract

The conductivity (i.e., n-type or p-type) of Cu2O films is controlled by the electrodeposition potential. A slightly acidic solution (pH 4.93) containing cupric acetate and sodium dodecyl sulfate (SDS) is used. Photoelectrochemical measurements at zero bias indicate that the Cu2O films deposited at the potentials of 0.00 V and -0.05 V generate the ntype photocurrents and the films deposited at the potentials negative than -0.10 V generate the p-type photocurrents. The X-ray diffraction (XRD) results show that the n-type films are pure Cu2O, however, the metallic copper appear in the ptype Cu2O films. Mott-Schottky measurements show that the donor concentrations of the n-type Cu2O films decrease and the acceptor concentrations of the p-type Cu2O films increase with the decrease of the deposition potential. The SDS molecules adsorbed on electrode surface and the SDS micelles block the diffusion of Cu2+ ions, resulting in a low diffusion rate of Cu2+ ions. Under this circumstance, the growth of Cu2O films are affected significantly by the overpotential. When the potential is positive than -0.05 V, oxygen vacancies are formed in the films leading to the n-type conductivity; however, when the potential is negative than -0.10 V, the Cu2+ ions are reduced to Cu+ rapidly and part of Cu2+ are reduced to metallic copper, the diffused Cu2+ ions to supply to the growth of Cu2O films are insufficient, hence copper vacancies are formed in the films resulting in the p-type conductivity.
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电势对电沉积Cu2O薄膜电导率的影响
Cu2O薄膜的电导率(即n型或p型)由电沉积电位控制。使用含有醋酸铜和十二烷基硫酸钠(SDS)的微酸性溶液(pH值4.93)。零偏置下的光电化学测量表明,在0.00 V和-0.05 V电位下沉积的Cu2O膜产生了n型光电流,而在-0.10 V以下沉积的Cu2O膜产生了p型光电流。x射线衍射(XRD)结果表明,n型Cu2O薄膜为纯Cu2O,而p型Cu2O薄膜中出现了金属铜。Mott-Schottky测量结果表明,随着沉积电位的降低,n型Cu2O膜的施主浓度降低,p型Cu2O膜的受体浓度升高。SDS分子吸附在电极表面,SDS胶束阻挡了Cu2+离子的扩散,导致Cu2+离子的扩散速率较低。在这种情况下,Cu2O薄膜的生长受到过电位的显著影响。当电位大于-0.05 V时,薄膜中形成氧空位,形成n型电导率;然而,当电位小于-0.10 V时,Cu2+离子迅速还原为Cu+,部分Cu2+被还原为金属铜,扩散的Cu2+离子供给Cu2O膜生长的不足,从而在膜中形成铜空位,形成p型电导率。
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