Electrical properties of ZnSe Langmuir-Blodgett film MIS devices

D. Das-Gupta, P. Townshend, J. Williams, F. R. Mayers, S. Luk, N. Maung
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Abstract

A typical set of current-voltage characteristics of an Au-GaAs-ZnSe-Au device in the temperature range of -23.5 to 53 degrees C is presented. It is demonstrated that the conduction mechanism in sandwich structures of Au-GaAs-ZnSe-Au is electrode limited, the Schottky barrier being lowered at the interface. This barrier has been observed to be nonideal, possible due to the presence of interface states at the ZnSe surface.<>
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ZnSe Langmuir-Blodgett薄膜MIS器件的电学性能
给出了一组典型的Au-GaAs-ZnSe-Au器件在-23.5 ~ 53℃温度范围内的电流-电压特性。结果表明,Au-GaAs-ZnSe-Au夹层结构的导电机制受电极限制,界面处的肖特基势垒降低。这个势垒被观察到是非理想的,可能是由于在ZnSe表面存在界面态。
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