D. Das-Gupta, P. Townshend, J. Williams, F. R. Mayers, S. Luk, N. Maung
{"title":"Electrical properties of ZnSe Langmuir-Blodgett film MIS devices","authors":"D. Das-Gupta, P. Townshend, J. Williams, F. R. Mayers, S. Luk, N. Maung","doi":"10.1109/CEIDP.1988.26333","DOIUrl":null,"url":null,"abstract":"A typical set of current-voltage characteristics of an Au-GaAs-ZnSe-Au device in the temperature range of -23.5 to 53 degrees C is presented. It is demonstrated that the conduction mechanism in sandwich structures of Au-GaAs-ZnSe-Au is electrode limited, the Schottky barrier being lowered at the interface. This barrier has been observed to be nonideal, possible due to the presence of interface states at the ZnSe surface.<<ETX>>","PeriodicalId":149735,"journal":{"name":"1988. Annual Report., Conference on Electrical Insulation and Dielectric Phenomena","volume":"31 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1988. Annual Report., Conference on Electrical Insulation and Dielectric Phenomena","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CEIDP.1988.26333","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A typical set of current-voltage characteristics of an Au-GaAs-ZnSe-Au device in the temperature range of -23.5 to 53 degrees C is presented. It is demonstrated that the conduction mechanism in sandwich structures of Au-GaAs-ZnSe-Au is electrode limited, the Schottky barrier being lowered at the interface. This barrier has been observed to be nonideal, possible due to the presence of interface states at the ZnSe surface.<>