Pub Date : 1988-10-16DOI: 10.1109/CEIDP.1988.26375
T. Lebey, C. Laurent, C. Mayoux
The authors present a highly sensitive experimental setup that allows the analog time-resolved measurement of the trapped charge during AC polarization at high field in a double-needle sample configuration. In the first step, the capacitive charge is exactly compensated in a differential bridge. The polarization component is subsequently eliminated by differentiation between two identical samples. The authors present experimental results concerning low-density polyethylene and polyepoxy samples. The AC threshold fields for charge injection are compared for both materials.<>
{"title":"Charge injection in polymeric samples: a new experimental analogic set up","authors":"T. Lebey, C. Laurent, C. Mayoux","doi":"10.1109/CEIDP.1988.26375","DOIUrl":"https://doi.org/10.1109/CEIDP.1988.26375","url":null,"abstract":"The authors present a highly sensitive experimental setup that allows the analog time-resolved measurement of the trapped charge during AC polarization at high field in a double-needle sample configuration. In the first step, the capacitive charge is exactly compensated in a differential bridge. The polarization component is subsequently eliminated by differentiation between two identical samples. The authors present experimental results concerning low-density polyethylene and polyepoxy samples. The AC threshold fields for charge injection are compared for both materials.<<ETX>>","PeriodicalId":149735,"journal":{"name":"1988. Annual Report., Conference on Electrical Insulation and Dielectric Phenomena","volume":"100 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116673128","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-10-16DOI: 10.1109/CEIDP.1988.26305
R. Latham
It is well established that the insulating capability of a high-voltage (HV) vacuum gap is ultimately limited by electrode surface processes and, in particular, by the field-induced emission of electrons from anomalous microscopic 'sites' that occur randomly on an electrode surface. The author reviews the fundamental studies that have led to an understanding of this phenomenon. Issues discussed are the location and identification of electron emission sites, the emission characteristics of sites, and the emission mechanism. The author concludes with a discussion of the technological implications of his knowledge, particularly in relation to the many emerging applications associated with the development of space-based power systems.<>
{"title":"High voltage vacuum insulation: new horizons","authors":"R. Latham","doi":"10.1109/CEIDP.1988.26305","DOIUrl":"https://doi.org/10.1109/CEIDP.1988.26305","url":null,"abstract":"It is well established that the insulating capability of a high-voltage (HV) vacuum gap is ultimately limited by electrode surface processes and, in particular, by the field-induced emission of electrons from anomalous microscopic 'sites' that occur randomly on an electrode surface. The author reviews the fundamental studies that have led to an understanding of this phenomenon. Issues discussed are the location and identification of electron emission sites, the emission characteristics of sites, and the emission mechanism. The author concludes with a discussion of the technological implications of his knowledge, particularly in relation to the many emerging applications associated with the development of space-based power systems.<<ETX>>","PeriodicalId":149735,"journal":{"name":"1988. Annual Report., Conference on Electrical Insulation and Dielectric Phenomena","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117255129","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-10-16DOI: 10.1109/CEIDP.1988.26356
S. Tyagi, Santosh, P. Vasudevan
The electrical properties of the Fe-Pc system were studied with and without exposure to air during synthesis and heat treatment under vacuum. The results indicated significant differences in dielectric behavior between samples prepared in air and N/sub 2/, with heat treatments modifying electrical properties. It is concluded that the method of synthesis and subsequent heat treatment affect the electrical and electrochemical behavior of these compounds.<>
{"title":"Dielectric behaviour of monomeric and polymeric iron-phthalocyanine","authors":"S. Tyagi, Santosh, P. Vasudevan","doi":"10.1109/CEIDP.1988.26356","DOIUrl":"https://doi.org/10.1109/CEIDP.1988.26356","url":null,"abstract":"The electrical properties of the Fe-Pc system were studied with and without exposure to air during synthesis and heat treatment under vacuum. The results indicated significant differences in dielectric behavior between samples prepared in air and N/sub 2/, with heat treatments modifying electrical properties. It is concluded that the method of synthesis and subsequent heat treatment affect the electrical and electrochemical behavior of these compounds.<<ETX>>","PeriodicalId":149735,"journal":{"name":"1988. Annual Report., Conference on Electrical Insulation and Dielectric Phenomena","volume":"44 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124840447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-10-16DOI: 10.1109/CEIDP.1988.26313
S. Haridoss, J. Crine, A. Bulinski, J. Densley, S. Bamji
In order to detect oxidation in water trees, the authors performed micro-FTIR spectroscopy and oxidative induction time (OIT) measurements in many trees grown in various field-aged distribution cables. It is concluded that there is no definitive evidence that oxidation affects water-tree initiation in field-aged cross-linked polyethylene cables. It is found, in fact, that trees may be less oxidized than untreed insulations. It seems that the reduced OIT values of aged cables correspond to reduced antioxidant content.<>
{"title":"Oxidation in water-trees grown in field-aged cables","authors":"S. Haridoss, J. Crine, A. Bulinski, J. Densley, S. Bamji","doi":"10.1109/CEIDP.1988.26313","DOIUrl":"https://doi.org/10.1109/CEIDP.1988.26313","url":null,"abstract":"In order to detect oxidation in water trees, the authors performed micro-FTIR spectroscopy and oxidative induction time (OIT) measurements in many trees grown in various field-aged distribution cables. It is concluded that there is no definitive evidence that oxidation affects water-tree initiation in field-aged cross-linked polyethylene cables. It is found, in fact, that trees may be less oxidized than untreed insulations. It seems that the reduced OIT values of aged cables correspond to reduced antioxidant content.<<ETX>>","PeriodicalId":149735,"journal":{"name":"1988. Annual Report., Conference on Electrical Insulation and Dielectric Phenomena","volume":"37 8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129043736","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-10-16DOI: 10.1109/CEIDP.1988.26318
V. K. Agarwal, L. Hatfield
The author reports a preliminary model which allows the ranking of thermoplastic and thermosetting compounds for high-voltage applications using ASTM data on various properties. He considered only 18 of the most widely used thermoplastics and five thermosetting compounds. The dielectric and electrical properties included in the ranking are dielectric constant, dielectric loss factor, volume resistivity, and arc resistance. The mechanical and thermal properties considered are tensile strength and impact strength, deflection temperature, and maximum operating temperature. These and other properties are assigned a ranking between 1 and 5 corresponding to the material being poor if ranked 1 and very good if ranked 5. It is found that out of the materials evaluated, only a handful earned an index number in the satisfactory to good range. It is concluded that probably no solid insulating material is available which would be ranked excellent for all dielectric, electrical, mechanical, thermal, and other physical properties.<>
{"title":"A model for ranking thermoplastic and thermosetting compounds for HV applications","authors":"V. K. Agarwal, L. Hatfield","doi":"10.1109/CEIDP.1988.26318","DOIUrl":"https://doi.org/10.1109/CEIDP.1988.26318","url":null,"abstract":"The author reports a preliminary model which allows the ranking of thermoplastic and thermosetting compounds for high-voltage applications using ASTM data on various properties. He considered only 18 of the most widely used thermoplastics and five thermosetting compounds. The dielectric and electrical properties included in the ranking are dielectric constant, dielectric loss factor, volume resistivity, and arc resistance. The mechanical and thermal properties considered are tensile strength and impact strength, deflection temperature, and maximum operating temperature. These and other properties are assigned a ranking between 1 and 5 corresponding to the material being poor if ranked 1 and very good if ranked 5. It is found that out of the materials evaluated, only a handful earned an index number in the satisfactory to good range. It is concluded that probably no solid insulating material is available which would be ranked excellent for all dielectric, electrical, mechanical, thermal, and other physical properties.<<ETX>>","PeriodicalId":149735,"journal":{"name":"1988. Annual Report., Conference on Electrical Insulation and Dielectric Phenomena","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129074654","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-10-16DOI: 10.1109/CEIDP.1988.26355
I. Alexeff, A. Wintenberg, D. Pittman, M. Pace, F. Dyer, M. Rader
The growth and structure of prebreakdown streamers extending from a negative DC-biased steel needle having a round tip of 3 mu m radius were recorded with an intensifier-equipped video camera and video-cassette recorder. The structure as observed in its self-luminous light is quite similar in size and shape to those observed in previous experiments using transmitted light. The results are interpreted in terms of a theoretical study of electrostatically inflated bubbles in the fluid.<>
{"title":"Self-luminous, pre-breakdown phenomena in liquid hexane","authors":"I. Alexeff, A. Wintenberg, D. Pittman, M. Pace, F. Dyer, M. Rader","doi":"10.1109/CEIDP.1988.26355","DOIUrl":"https://doi.org/10.1109/CEIDP.1988.26355","url":null,"abstract":"The growth and structure of prebreakdown streamers extending from a negative DC-biased steel needle having a round tip of 3 mu m radius were recorded with an intensifier-equipped video camera and video-cassette recorder. The structure as observed in its self-luminous light is quite similar in size and shape to those observed in previous experiments using transmitted light. The results are interpreted in terms of a theoretical study of electrostatically inflated bubbles in the fluid.<<ETX>>","PeriodicalId":149735,"journal":{"name":"1988. Annual Report., Conference on Electrical Insulation and Dielectric Phenomena","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125729893","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-10-16DOI: 10.1109/CEIDP.1988.26363
A. Jonscher
Experimental evidence is collected which points strongly to the existence of a connection between spatially discrete low-dimensional flow of charges in various interfacial situations and the frequency-dependent nature of this transport. It is pointed out that this is a property not only of the ionically conducting systems, such as humid insulators, but also of such purely electronic systems as MOSFETs. It is noted that the spatially discrete filamentary flow of the type discussed is frequently associated with fractal phenomena. On the other hand, the fractional-power time-dependence of the universal law is also linked with fractal processes in the time domain. It is emphasized that what is not clear is whether there is any necessary connection between space and time fractality. It is concluded that the present study may provide material for the furtherance of the relevant theoretical considerations.<>
{"title":"Time-resolved low-dimensional currents at insulator interfaces","authors":"A. Jonscher","doi":"10.1109/CEIDP.1988.26363","DOIUrl":"https://doi.org/10.1109/CEIDP.1988.26363","url":null,"abstract":"Experimental evidence is collected which points strongly to the existence of a connection between spatially discrete low-dimensional flow of charges in various interfacial situations and the frequency-dependent nature of this transport. It is pointed out that this is a property not only of the ionically conducting systems, such as humid insulators, but also of such purely electronic systems as MOSFETs. It is noted that the spatially discrete filamentary flow of the type discussed is frequently associated with fractal phenomena. On the other hand, the fractional-power time-dependence of the universal law is also linked with fractal processes in the time domain. It is emphasized that what is not clear is whether there is any necessary connection between space and time fractality. It is concluded that the present study may provide material for the furtherance of the relevant theoretical considerations.<<ETX>>","PeriodicalId":149735,"journal":{"name":"1988. Annual Report., Conference on Electrical Insulation and Dielectric Phenomena","volume":"75 3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132330675","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-10-16DOI: 10.1109/CEIDP.1988.26310
Z. Kołaczkowski, A. Rybski, S. Grzybowski, E. Kuffel
Investigations were carried out to determine the increase in the electric strength of nonuniform field gaps in vacuum caused by transverse magnetic field. The measurements were under voltages with gaps ranging from 1.0 to 5.0 mm. The results show that a transverse magnetic field in excess of 0.1 T causes an increase in the electric strength of vacuum insulation, with the effect increasing with the magnitude of the magnetic field. Increases in the breakdown strength of up to 50% were observed. The largest increase of breakdown voltage was noted for a positive needle-plane electrode arrangement. The amount of increase was less for a needle-needle arrangement, and least for a negative needle-plane electrode arrangement.<>
{"title":"Electric strength of point-point and point-plane gaps in vacuum in the presence of transverse magnetic field","authors":"Z. Kołaczkowski, A. Rybski, S. Grzybowski, E. Kuffel","doi":"10.1109/CEIDP.1988.26310","DOIUrl":"https://doi.org/10.1109/CEIDP.1988.26310","url":null,"abstract":"Investigations were carried out to determine the increase in the electric strength of nonuniform field gaps in vacuum caused by transverse magnetic field. The measurements were under voltages with gaps ranging from 1.0 to 5.0 mm. The results show that a transverse magnetic field in excess of 0.1 T causes an increase in the electric strength of vacuum insulation, with the effect increasing with the magnitude of the magnetic field. Increases in the breakdown strength of up to 50% were observed. The largest increase of breakdown voltage was noted for a positive needle-plane electrode arrangement. The amount of increase was less for a needle-needle arrangement, and least for a negative needle-plane electrode arrangement.<<ETX>>","PeriodicalId":149735,"journal":{"name":"1988. Annual Report., Conference on Electrical Insulation and Dielectric Phenomena","volume":"169 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133987077","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-10-16DOI: 10.1109/CEIDP.1988.26332
K. Miyairi
The author investigated electric breakdown and electroluminescence at high field in Ta/sub 2/O/sub 5/ thin films obtained by anodizing Ta foils and films sputtered in an argon plasma. The electroluminescence manifests a strong dependence on electric field, but weak dependence on temperature. Electroluminescence in the high-field region near the breakdown is associated with electron avalanche by injected electrons from the electrode. The spectrum of the emitted light has a peak at 600 nm.<>
{"title":"Electrical breakdown and electroluminescence in tantalum pentoxide films","authors":"K. Miyairi","doi":"10.1109/CEIDP.1988.26332","DOIUrl":"https://doi.org/10.1109/CEIDP.1988.26332","url":null,"abstract":"The author investigated electric breakdown and electroluminescence at high field in Ta/sub 2/O/sub 5/ thin films obtained by anodizing Ta foils and films sputtered in an argon plasma. The electroluminescence manifests a strong dependence on electric field, but weak dependence on temperature. Electroluminescence in the high-field region near the breakdown is associated with electron avalanche by injected electrons from the electrode. The spectrum of the emitted light has a peak at 600 nm.<<ETX>>","PeriodicalId":149735,"journal":{"name":"1988. Annual Report., Conference on Electrical Insulation and Dielectric Phenomena","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114690418","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1988-10-16DOI: 10.1109/CEIDP.1988.26367
R. E. Barker, K. Campbell
The change in macroscopic polarization of ferroelectric polymers, when the applied field E is increased, is considered to be due to the growth of certain saturated domains at the expense of less favored adjacent domains with different directions of polarization. The rate of switching from one state of polarization to another can be viewed as a thermally activated process where the activation energy depends approximately linearly, with a negative slope, on E. Some data for PVDF (polyvinylidene fluoride) are analyzed to demonstrate this fact. Molecular models, based on statistical thermodynamical considerations of polarization domains of cylindrical shape, are discussed.<>
{"title":"Models for the dependence of switching time on electric field in ferroelectric polymers","authors":"R. E. Barker, K. Campbell","doi":"10.1109/CEIDP.1988.26367","DOIUrl":"https://doi.org/10.1109/CEIDP.1988.26367","url":null,"abstract":"The change in macroscopic polarization of ferroelectric polymers, when the applied field E is increased, is considered to be due to the growth of certain saturated domains at the expense of less favored adjacent domains with different directions of polarization. The rate of switching from one state of polarization to another can be viewed as a thermally activated process where the activation energy depends approximately linearly, with a negative slope, on E. Some data for PVDF (polyvinylidene fluoride) are analyzed to demonstrate this fact. Molecular models, based on statistical thermodynamical considerations of polarization domains of cylindrical shape, are discussed.<<ETX>>","PeriodicalId":149735,"journal":{"name":"1988. Annual Report., Conference on Electrical Insulation and Dielectric Phenomena","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1988-10-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122118059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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