Influence of chromium sublayer on silicon P-I-N photodiodes responsivity

M. Kukurudziak, E. Maistruk
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引用次数: 6

Abstract

The level of silicon p-i-n photodiodes responsivity depending on thickness of the chromium sublayer on the back side of the device crystal, which is deposited to improve adhesion of gold, was studied. Transmission spectra of the chromiumfilm at its different thicknesses were obtained. It was found that starting from the sublayer thickness of 17 nm and less, the transmittance changes by one percent, which does not lead to an increase in photoresponsivity with a further decrease in the thickness of chromium.
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铬亚层对硅P-I-N光电二极管响应性的影响
研究了硅p-i-n光电二极管的响应性水平与器件晶体背面铬亚层厚度的关系,铬亚层的沉积是为了提高金的粘附性。得到了铬膜在不同厚度下的透射光谱。研究发现,从17 nm以下的亚层厚度开始,透过率变化了1%,这并不会导致光响应率随着铬厚度的进一步降低而增加。
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