Implicit test of high-speed analog circuits using non-intrusive sensors

Abstract

Testing the analog functions of a system-on-chip makes up the major portion of test cost - up to 50% according to anecdotal evidence - although analog circuits occupy less than 5% of the die area. Furthermore, cases have been reported where the test cost actually surpasses the overall manufacturing cost. This shows that analog test is in the coming years an area for industry focus, innovation and improvement.