{"title":"Transient response of electronic devices and their failure mechanism","authors":"S. Tyagi","doi":"10.1109/ICEMIC.1999.871691","DOIUrl":null,"url":null,"abstract":"The paper presents the failure mechanism of some of the commonly used components in electronic systems when transients appear upon them. It is estimated theoretically that low power transistors and microwave mixer diode are most susceptible to incoming transients with energy of the order of 1 /spl mu/J or even less.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICEMIC.1999.871691","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 3
Abstract
The paper presents the failure mechanism of some of the commonly used components in electronic systems when transients appear upon them. It is estimated theoretically that low power transistors and microwave mixer diode are most susceptible to incoming transients with energy of the order of 1 /spl mu/J or even less.
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