{"title":"Laboratory Bench for Predicting the Reliability of Wireless Devices Based on the NI MyRIO Platform","authors":"V. Zhadnov, K. Sedov, P. Korolev, A. Sosnin","doi":"10.1109/SIBCON.2019.8729600","DOIUrl":null,"url":null,"abstract":"The report discusses the use of National Instruments tools for dependability prediction of electronic devices by simulation modeling. The description of the laboratory bench allowing to develop formal models based on reliability block diagrams, to carry out simulation experiment and to process statistical modeling results, is given as well as an example of this bench usage for reliability prediction of power supply of the lightweight spacecraft.","PeriodicalId":408993,"journal":{"name":"2019 International Siberian Conference on Control and Communications (SIBCON)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2019-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2019 International Siberian Conference on Control and Communications (SIBCON)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SIBCON.2019.8729600","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
The report discusses the use of National Instruments tools for dependability prediction of electronic devices by simulation modeling. The description of the laboratory bench allowing to develop formal models based on reliability block diagrams, to carry out simulation experiment and to process statistical modeling results, is given as well as an example of this bench usage for reliability prediction of power supply of the lightweight spacecraft.
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