Design verification considering manufacturing tolerances by using worst-case distances

H. Graeb, Claudia U. Wieser, K. Antreich
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引用次数: 4

Abstract

A new method for design verification on circuit level considering the inevitable manufacturing tolerances is presented. It is based on a specific backward evaluation of performance specifications, which can be done efficiently with a sequential quadratic programming method using standard simulation tools. The specific backward evaluation yields exact worst-case parameter sets and corresponding worst-case distances for all specifications separately. Automatic circuit quality analysis enables a detailed design verification and supports the circuit design process by planning aids for a design step. The various features of the method are illustrated using a small tutorial circuit example. A practical example of an integrated CMOS analog circuit proves the efficiency of the new approach.<>
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通过使用最坏情况距离考虑制造公差的设计验证
提出了一种考虑不可避免的制造公差的电路级设计验证方法。它基于对性能规格的特定后向评估,可以通过使用标准仿真工具的顺序二次规划方法有效地完成。具体的反向评估分别为所有规格产生确切的最坏情况参数集和相应的最坏情况距离。自动电路质量分析能够进行详细的设计验证,并通过规划辅助设计步骤来支持电路设计过程。该方法的各种特点是用一个小的教程电路实例说明。一个集成CMOS模拟电路的实例证明了该方法的有效性。
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