{"title":"Design verification considering manufacturing tolerances by using worst-case distances","authors":"H. Graeb, Claudia U. Wieser, K. Antreich","doi":"10.1109/EURDAC.1992.246260","DOIUrl":null,"url":null,"abstract":"A new method for design verification on circuit level considering the inevitable manufacturing tolerances is presented. It is based on a specific backward evaluation of performance specifications, which can be done efficiently with a sequential quadratic programming method using standard simulation tools. The specific backward evaluation yields exact worst-case parameter sets and corresponding worst-case distances for all specifications separately. Automatic circuit quality analysis enables a detailed design verification and supports the circuit design process by planning aids for a design step. The various features of the method are illustrated using a small tutorial circuit example. A practical example of an integrated CMOS analog circuit proves the efficiency of the new approach.<<ETX>>","PeriodicalId":218056,"journal":{"name":"Proceedings EURO-DAC '92: European Design Automation Conference","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings EURO-DAC '92: European Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EURDAC.1992.246260","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
A new method for design verification on circuit level considering the inevitable manufacturing tolerances is presented. It is based on a specific backward evaluation of performance specifications, which can be done efficiently with a sequential quadratic programming method using standard simulation tools. The specific backward evaluation yields exact worst-case parameter sets and corresponding worst-case distances for all specifications separately. Automatic circuit quality analysis enables a detailed design verification and supports the circuit design process by planning aids for a design step. The various features of the method are illustrated using a small tutorial circuit example. A practical example of an integrated CMOS analog circuit proves the efficiency of the new approach.<>