The Evaluation of Error Detection Probability at the Outputs of Combinational Circuits Under Concurrent Error Detection on the Basis of Summation Codes

D. Efanov, V. Sapozhnikov, V. Sapozhnikov, Dmitry Plotnikov
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引用次数: 3

Abstract

One of the most common approaches to building concurrent error detection systems of combinational logical circuits is the application of separable block-structured codes. In previous studies of the authors it was established that characteristics of the code directly determine properties of the concurrent error detection system on detecting errors in the unit under test. The choice of a code influences the method of implementation of the concurrent error detection system, including the solution of tasks aimed at control organization of the device which detects all types of errors from the given class, or errors of the given class with the predetermined probability. The authors of the study in question offer the evaluation procedure of error-detection probability in combinational logical circuits under concurrent error detection of the latter on the basis of separable block-structured codes. The authors only consider the model of single stuck-at faults at the outputs of logical elements of the inner structure of a combinational circuit, however the approach itself is universal and after certain improvement may be applied for the evaluation of error-detection probability at the outputs of combinational circuits taking into account other fault models. The example of calculating errordetection probability was given, as well as test results of check combinational circuits from LGSynth'89 set on the evaluation of error-detection probability at the outputs of circuits under concurrent error detection, on the basis of the weight-based code with summation without carries.
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基于求和码的并发错误检测下组合电路输出错误检测概率评估
构建组合逻辑电路并发错误检测系统最常用的方法之一是应用可分离的块结构代码。在作者之前的研究中,已经确定了代码的特性直接决定了并发错误检测系统在被测单元中检测错误的性能。代码的选择影响并发错误检测系统的实现方法,包括旨在检测来自给定类别的所有类型错误或以预定概率检测给定类别错误的设备的控制组织的任务的解决方案。本文基于可分离的块结构码,给出了组合逻辑电路在并发错误检测情况下的错误检测概率评估方法。本文只考虑了组合电路内部结构逻辑元件输出端单个卡死故障的模型,但该方法本身具有通用性,经过一定改进后,可用于考虑其他故障模型的组合电路输出端错误检测概率的评估。给出了计算检错概率的实例,并给出了LGSynth'89集合的校验组合电路在并行检错情况下,基于无进位求和加权码对电路输出端的检错概率进行评估的测试结果。
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