Challenges in High Speed Interface Testing

S. Abdennadher, S. Shaikh
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引用次数: 2

Abstract

There is a common trend towards the incorporation of Serial Interfaces into Systems-on-Chips (SoC), both for inter-chip and intra-chip high-bandwidth data transfers. Serial interfaces have the same channel medium drives as Parallel interfaces and provide increased data rates and fewer interconnects. High speed serial interfaces, such as SATA, Hyper- Transport, and PCI Express, are becoming pervasive in networking and in computer equipment. Some computer interfaces are converging to communications interfaces. Today, speeds for these serial interfaces range from 1.5 to 3.3 Gbps; in the near future, they will reach 6.4 Gbps and beyond (Figure 1).
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高速接口测试中的挑战
有一个共同的趋势是将串行接口集成到片上系统(SoC)中,用于芯片间和芯片内的高带宽数据传输。串行接口具有与并行接口相同的通道介质驱动器,并提供更高的数据速率和更少的互连。高速串行接口,如SATA、Hyper- Transport和PCI Express,在网络和计算机设备中变得越来越普遍。一些计算机接口正在向通信接口靠拢。如今,这些串行接口的速度范围从1.5到3.3 Gbps;在不久的将来,它们将达到6.4 Gbps甚至更高(图1)。
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