{"title":"A Method of Detecting Hot Spots on Semiconductors using Liquid Crystals","authors":"J. Hiatt","doi":"10.1109/IRPS.1981.362984","DOIUrl":null,"url":null,"abstract":"This paper presents a failure analysis technique which uses cholesteric liquid crystals and polarized light to locate areas of high power dissipation on an integrated circuit. The technique is non-destructive and can be performed in a few minutes using common failure analysis equipment. An example is given involving the analysis of a CMOS latch-up mechanism.","PeriodicalId":376954,"journal":{"name":"19th International Reliability Physics Symposium","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1981-04-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"53","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"19th International Reliability Physics Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IRPS.1981.362984","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 53
Abstract
This paper presents a failure analysis technique which uses cholesteric liquid crystals and polarized light to locate areas of high power dissipation on an integrated circuit. The technique is non-destructive and can be performed in a few minutes using common failure analysis equipment. An example is given involving the analysis of a CMOS latch-up mechanism.
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