Aging of epoxy moulding compound — Thermomechanical properties during high temperature storage

Bingbing Zhang, M. Johlitz, A. Lion, L. Ernst, K. Jansen, D. Vu, L. Weiss
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引用次数: 9

Abstract

It is well known that epoxy moulding compound (EMC) plays an important role in the reliability of electronic packages. In order to predict the mechanical behaviour of electronic packages that are encapsulated with moulding compound, the material properties of EMCs should be carefully characterized and modelled. Currently, more and more components are exposed to severe environments. Among these, high temperature conditions can lead to irreversible changes in EMCs. These changes can be attributed to chemical processes such as oxidation and can lead to degradation of the applied resins, which we refer to here as aging. As a result, the thermo-mechanical properties of the EMCs change severely with time. Due to ongoing changes in the aging EMC of a package, the stress and strain distributions in the package change with time, while embrittlement affects the fracture strength. As a consequence, the long-term reliability of a package is severely affected. Since an appropriate constitutive representation of the material properties of the slowly growing oxidation layers is not available, it is cumbersome to predict the reliability of real packages for long term applications. Being motivated by this limitation, in the present work, we focus on the experimental characterization as well as on the numerical modelling of aging of EMCs at high temperature storage (HTS). As a result the long term stress-strain distribution of a package can be simulated.
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环氧模塑复合材料的老化。高温贮存期间的热机械性能
众所周知,环氧成型化合物(EMC)对电子封装的可靠性起着至关重要的作用。为了预测用模塑化合物封装的电子封装的力学行为,应该仔细地表征和模拟电磁电容器的材料特性。目前,越来越多的部件暴露在恶劣的环境中。其中,高温条件会导致EMCs发生不可逆转的变化。这些变化可归因于氧化等化学过程,并可能导致所涂树脂的降解,我们在这里称之为老化。因此,随着时间的推移,电磁材料的热机械性能发生了剧烈的变化。由于封装的老化电磁兼容性不断变化,封装中的应力和应变分布随时间变化,而脆化影响断裂强度。因此,封装的长期可靠性受到严重影响。由于缓慢生长的氧化层的材料性能的适当的本构表示是不可用的,因此预测长期应用的实际封装的可靠性是很麻烦的。由于这一限制,在目前的工作中,我们重点研究了EMCs在高温储存(HTS)下老化的实验表征和数值模拟。因此,可以模拟包件的长期应力-应变分布。
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