Path-based test composition for mixed-signal SOC's

Abstract

We outline a methodology for system level test composition out of module level tests in the context of system-on-a-chip (SOC). The method can be utilized as soon as high level specifications are available providing avenues for testability insertion. The digital/analog interface is handled by a conversion from digital bits to analog signals. Experimental results show that high fault and yield coverages for most tests can be attained with no hardware alterations.