Pushing deep greyscale lithography beyond 100-µm pattern depth with a novel photoresist

C. Schuster, G. Ekindorf, A. Voigt, A. Schleunitz, G. Gruetzner
{"title":"Pushing deep greyscale lithography beyond 100-µm pattern depth with a novel photoresist","authors":"C. Schuster, G. Ekindorf, A. Voigt, A. Schleunitz, G. Gruetzner","doi":"10.1117/12.2661526","DOIUrl":null,"url":null,"abstract":"Greyscale lithography for the manufacture of complex 2.5D and freeform microstructures in photoresists receives increasing attention from industry for the fabrication of advanced micro-optical elements. The thus obtained structures serve as master or template for different methods of pattern transfer into materials for final, permanent applications, such as refractive and diffractive lenses, blazed gratings, beam-shapers etc. However, many such applications require large structure heights beyond 100 μm which was not easily accessible until now. We present a novel photoresist, mr-P 22G_XP, enabling greyscale lithography of very deep patterns. Issues limiting the pattern depth caused by the photoresist chemistry were addressed. Greyscale pattern depths of 120 μm were possible with an easily accessible set-up with this prototype, with a well-considered choice of photoresist ingredients, and lithography process adjustments focusing on laser direct writing, with the prospect of even deeper patterns up to 140–150 μm.","PeriodicalId":212235,"journal":{"name":"Advanced Lithography","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2023-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Advanced Lithography","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2661526","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

Abstract

Greyscale lithography for the manufacture of complex 2.5D and freeform microstructures in photoresists receives increasing attention from industry for the fabrication of advanced micro-optical elements. The thus obtained structures serve as master or template for different methods of pattern transfer into materials for final, permanent applications, such as refractive and diffractive lenses, blazed gratings, beam-shapers etc. However, many such applications require large structure heights beyond 100 μm which was not easily accessible until now. We present a novel photoresist, mr-P 22G_XP, enabling greyscale lithography of very deep patterns. Issues limiting the pattern depth caused by the photoresist chemistry were addressed. Greyscale pattern depths of 120 μm were possible with an easily accessible set-up with this prototype, with a well-considered choice of photoresist ingredients, and lithography process adjustments focusing on laser direct writing, with the prospect of even deeper patterns up to 140–150 μm.
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用一种新型光刻胶推动深度灰度光刻超过100微米的图案深度
灰阶光刻技术用于制造复杂的2.5D和自由形状光刻胶微结构,越来越受到业界的关注,用于制造先进的微光学元件。由此获得的结构可作为将图案转移到最终、永久应用的材料中的不同方法的主模板或模板,例如折射透镜和衍射透镜、燃烧光栅、光束成形器等。然而,许多此类应用需要超过100 μm的大型结构高度,这在目前还不容易实现。我们提出了一种新的光刻胶,mr-P 22G_XP,使灰度光刻非常深的图案。解决了由光刻胶化学引起的限制图案深度的问题。该原型机的灰度图案深度可达120 μm,通过精心选择光刻胶成分,光刻工艺调整侧重于激光直写,可以实现更深的图案深度达140-150 μm。
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