Embedded Built-In-Test Detection Circuit for Radio Frequency Systems and Circuits

2006 IEEE Design and Diagnostics of Electronic Circuits and systems Pub Date : 2006-04-18 DOI:10.1109/DDECS.2006.1649582

Guoyan Zhang, R. Farrell

引用次数: 0

Abstract

An embedded rectifier-based built-in-test (BIT) detection circuit for the RF integrated circuits is proposed, and is adopted to transform the RF output signal into DC signal. In this BIT circuit, low threshold voltage MOS transistor with positive substrate bias is used to act as diode to further improve the detecting sensitivity. With this BIT circuit, the minimum input testing sensitivity can be improved to -50dBm. Also, this circuit doesn't consume current and has very high operating frequency scalability. As an example 2.4GHz low noise amplifier has been verified by using this BIT detection circuit, and gain and linearity are extracted

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射频系统与电路的嵌入式测试检测电路

提出了一种基于嵌入式整流器的射频集成电路BIT检测电路，用于将射频输出信号转换为直流信号。在该电路中，采用低阈值电压MOS晶体管作为二极管，衬底偏压为正，进一步提高了检测灵敏度。使用该位电路，最小输入测试灵敏度可以提高到-50dBm。此外，该电路不消耗电流，具有很高的工作频率可扩展性。以2.4GHz低噪声放大器为例，利用该BIT检测电路进行了验证，并提取了增益和线性度

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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2006 IEEE Design and Diagnostics of Electronic Circuits and systems

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