Advanced scan chain configuration method for broadcast decompressor architecture

Abstract

The paper deals with the problem of test data volume, decompressor hardware overhead and test application time of scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction and low decompressor hardware requirements. This paper presents an improved chain configuration method that enables both the test pattern overlapping technique and the test pattern broadcasting technique makes more efficiently. This new technique reduces substantially the number of conflicting bits in previously published scan chain reordering methods.