{"title":"Quantitative microwave imaging in Lp Banach spaces: A numerical assessment","authors":"A. Fedeli, M. Pastorino, A. Randazzo","doi":"10.1109/I2MTC.2015.7151599","DOIUrl":null,"url":null,"abstract":"A numerical assessment concerning the reconstruction capabilities of a recently proposed imaging measurement method working at microwave frequencies is proposed. The approach is based on the electric field integral equations of the inverse scattering problem, which are solved by using an iterative inexact-Newton method developed in Lp Banach spaces. Quantitative errors on the reconstruction of a canonical configuration are evaluated in different conditions. Accordingly, the effects of the choice of several parameters of the imaging configuration and operating conditions are discussed.","PeriodicalId":424006,"journal":{"name":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","volume":"30 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 IEEE International Instrumentation and Measurement Technology Conference (I2MTC) Proceedings","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/I2MTC.2015.7151599","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A numerical assessment concerning the reconstruction capabilities of a recently proposed imaging measurement method working at microwave frequencies is proposed. The approach is based on the electric field integral equations of the inverse scattering problem, which are solved by using an iterative inexact-Newton method developed in Lp Banach spaces. Quantitative errors on the reconstruction of a canonical configuration are evaluated in different conditions. Accordingly, the effects of the choice of several parameters of the imaging configuration and operating conditions are discussed.
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