{"title":"An approach to the selection of built-in-test devices","authors":"A. Rosin","doi":"10.1109/ARMS.1990.67981","DOIUrl":null,"url":null,"abstract":"A procedure is described by which reliability and maintainability considerations can be taken into account when ranking options for the selection of built-in test (BIT) devices. The type of constraints that are likely to influence BIT selection usually fall into one of the following categories: money, space and weight, manpower, time, and computer power and memory. Quality measures-factors which influence the overall objectives sought when employing BIT-are increasing the availability and reliability of the system and decreasing the system's probability of a safety incident when the BIT is capable of detecting safety-critical failure modes.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Annual Proceedings on Reliability and Maintainability Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARMS.1990.67981","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
A procedure is described by which reliability and maintainability considerations can be taken into account when ranking options for the selection of built-in test (BIT) devices. The type of constraints that are likely to influence BIT selection usually fall into one of the following categories: money, space and weight, manpower, time, and computer power and memory. Quality measures-factors which influence the overall objectives sought when employing BIT-are increasing the availability and reliability of the system and decreasing the system's probability of a safety incident when the BIT is capable of detecting safety-critical failure modes.<>
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