{"title":"A methodology for efficient simulation and diagnosis of mixed-signal systems using error waveforms","authors":"S. Cherubal, A. Chatterjee","doi":"10.1109/DFTVS.1999.802903","DOIUrl":null,"url":null,"abstract":"In this paper we present a novel approach for fast fault simulation of digital faults in mixed-signal systems without resorting to expensive mixed-signal simulation for every fault. The approach is based on partitioning the mixed-signal circuit and representing digital fault effects using error waveforms. We propose methods to compress a large number of digital fault effects into a few fault syndromes. This results in significant savings in fault simulation effort. We demonstrate the ability to differentiate fault syndromes of different partitions of the circuit.","PeriodicalId":448322,"journal":{"name":"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1999-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (EFT'99)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1999.802903","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
In this paper we present a novel approach for fast fault simulation of digital faults in mixed-signal systems without resorting to expensive mixed-signal simulation for every fault. The approach is based on partitioning the mixed-signal circuit and representing digital fault effects using error waveforms. We propose methods to compress a large number of digital fault effects into a few fault syndromes. This results in significant savings in fault simulation effort. We demonstrate the ability to differentiate fault syndromes of different partitions of the circuit.