Design and Analysis of MOSFET Based on Fan-out Panel-Level Package Technology

Z. Liang, Dongdong Shao, Kunpeng Ding, Chuang Tian
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引用次数: 1

Abstract

Nowadays, fan-out package has received extensive attention from enterprises and researchers because it possesses lower cost, smaller size, higher packaging efficiency, and better electrical and thermal performance. As one of the fan-out packages, panel-level fan-out package has advantages in single package cost, board utilization, and packaging efficiency. In this paper, based on the panel-level fan-out package process, a power MOSFET device is designed, which is composed of pads, solder, chip, circuits and molding compound. The drain of the chip is fixed on the copper pad by solder, and the gate and source are interconnected with the pads through laser drilling and electroplating processes. Finally, realize the electrical connection of the chip. In addition, the thermal resistance of the MOSFET device is analyzed by the commercial software ICEPAK. The results show that the thermal resistance of MOSFET based on fan-out panel-level package process is 43.44°C /W, which is 11.4% lower than the traditional wire-bonding process. The MOSFET based on fan-out panel-level package process has good heat dissipation performance.
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基于扇出面板级封装技术的MOSFET设计与分析
目前,扇形封装由于具有成本更低、体积更小、封装效率更高、电学和热学性能更好等优点,受到了企业和研究人员的广泛关注。面板级扇出封装作为扇出封装的一种,在单封装成本、板利用率和封装效率方面具有优势。本文基于面板级扇出封装工艺,设计了一种功率MOSFET器件,该器件由焊盘、焊料、芯片、电路和成型化合物组成。芯片的漏极通过焊料固定在铜垫上,栅极和源极通过激光打孔和电镀工艺与铜垫互连。最后,实现了芯片的电气连接。此外,利用商业软件ICEPAK对MOSFET器件的热阻进行了分析。结果表明,基于扇出面板级封装工艺的MOSFET热阻为43.44°C /W,比传统线键合工艺低11.4%;基于扇出面板级封装工艺的MOSFET具有良好的散热性能。
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