S. Tanaka, S. Atsumi, M. Momodomi, K. Shinada, K. Yoshikawa, Y. Nagakubo, K. Kanzaki
{"title":"A programmable 256K CMOS EPROM with on-chip test circuits","authors":"S. Tanaka, S. Atsumi, M. Momodomi, K. Shinada, K. Yoshikawa, Y. Nagakubo, K. Kanzaki","doi":"10.1109/ISSCC.1984.1156605","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":260117,"journal":{"name":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","volume":"106 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1984 IEEE International Solid-State Circuits Conference. Digest of Technical Papers","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.1984.1156605","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}