S. Dunn, D. Balazich, Lawrence K. Lange, Charlotte C. Montillo
{"title":"Pattern generator card, emulation, and debug","authors":"S. Dunn, D. Balazich, Lawrence K. Lange, Charlotte C. Montillo","doi":"10.1109/VTEST.1993.313379","DOIUrl":null,"url":null,"abstract":"Details a pattern generator card used in a high speed VLSI test system, a software emulation of that card, and card debug procedure. The Advanced Test System built at IBM East Fishkill contains primarily pin electronics cards, pattern generator cards, and power and clock distribution cards. The software emulator, called PGEM, for pattern generator emulation, serves two major purposes: it facilitates off-line debug of pattern generator cards; and, when used with a waveform tool, it permits verification of test programs without wasting system time. The simplification of off-line debug is important in terms of time savings and reduction of expensive incorrect diagnoses.<<ETX>>","PeriodicalId":283218,"journal":{"name":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers Eleventh Annual 1993 IEEE VLSI Test Symposium","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1993.313379","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Details a pattern generator card used in a high speed VLSI test system, a software emulation of that card, and card debug procedure. The Advanced Test System built at IBM East Fishkill contains primarily pin electronics cards, pattern generator cards, and power and clock distribution cards. The software emulator, called PGEM, for pattern generator emulation, serves two major purposes: it facilitates off-line debug of pattern generator cards; and, when used with a waveform tool, it permits verification of test programs without wasting system time. The simplification of off-line debug is important in terms of time savings and reduction of expensive incorrect diagnoses.<>
详细介绍了用于高速VLSI测试系统的模式生成卡，该卡的软件仿真，以及卡的调试过程。在IBM East Fishkill建立的高级测试系统主要包含引脚电子卡、模式生成器卡以及电源和时钟分配卡。用于模式生成器仿真的软件仿真器称为PGEM，主要有两个目的:便于模式生成器卡的离线调试;并且，当与波形工具一起使用时，它允许在不浪费系统时间的情况下验证测试程序。离线调试的简化在节省时间和减少昂贵的错误诊断方面是重要的。
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