Structural and ferroelectric properties of BiFeO3-BiCoO3 solid solution films

H. Naganuma, N. Shimura, H. Shima, S. Yasui, K. Nishida, T. Iijima, H. Funakubo, S. Okamura
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Abstract

BiFeO3-BiCoO3 solid solution films were fabricated by a chemical solution deposition (CSD) method onto the Pt/Ti/SiO2/Si(100) substrates followed by a post-deposition annealing at 873 K for 10 min. X-ray diffraction measurements indicate the apparent phase transition of the Bi(CoxFe1-times)O3 solid solution films by increasing the cobalt composition were take place at the cobalt composition of around x = 0.2 and 0.4, respectively. According to the D-E hysteresis measurements, the ferroelectricity observed at the cobalt composition less than x = 0.3 indicating that the MPB has a possibility to exist at these composition region.
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BiFeO3-BiCoO3固溶体薄膜的结构和铁电性能
采用化学溶液沉积(CSD)方法在Pt/Ti/SiO2/Si(100)衬底上制备了BiFeO3-BiCoO3固溶体薄膜,并在873 K下进行沉积后退火10 min。x射线衍射测量表明,当钴含量在x = 0.2和0.4左右时,随着钴含量的增加,Bi(CoxFe1-times)O3固溶体薄膜发生了明显的相变。根据D-E迟滞测量,在钴成分小于x = 0.3处观察到铁电性,表明MPB有可能存在于这些成分区域。
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